Fault Diagnosis of Analog Circuits Using dc Approach
Vaibhav Sharma1, Ankit Verma2
1Vaibhav Sharma, M. Tech Degree in Communication Engineering at Shobhit University, Lucknow (U.P), India.
2Ankit Verma, M. Tech Degree in Communication Engineering at Shobhit University, Lucknow (U.P), India.
Manuscript received on May 12, 2013. | Revised Manuscript received on June 13, 2013. | Manuscript published on June 30, 2013. | PP: 60-64 | Volume-2, Issue-5, June 2013. | Retrieval Number: E1677062513/2013©BEIESP
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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: Fault diagnosis of circuit is a key problem of theory of circuit networks and especially with the development of electronic technique at high speed, the increasing complexity of electronic equipment and altitudinal integration of electronic circuit, it is of importance in particular. Testing and diagnosis of electronic devices are fundamental topics in the development and maintenance of safe and reliable complex systems. In both cases, the attention is focused on the detection of faults affecting a subsystem whose appearance generally impairs the global system safety and performance. In a complete fault diagnosis procedure, fault detection and isolation must be carried out together; the effectiveness of the procedure depends on fault detection and isolation performance as well as the complexity of the test phase. While there are established techniques to obtain an automatic diagnosis for a digital circuit, the development of an effective automated diagnosis tool for analog or mixed circuits is still an open research field. For more than two decades, the subject of fault location in analog circuits has been of interest to researchers in circuits and systems. In recent years this interest has intensified and a number of promising results has emerged.
Keywords: In a complete fault diagnosis procedure.