Electrical Characterization of Spray Deposited CoS Thin Films
M. A. Sattar1, M. Mozibur Rahman2, M. K. R. Khan3, M. G. M. Choudhury4
1M. A. Sattar, Lecturer, Department of Materials Science & Engineering, University of Rajshashi, Bangladesh.
2M. Mozibur Rahman, Department of Physics, University of Rajshashi, Bangladesh.
3M. K. R. Khan, Department of Physics, University of Rajshashi,  Bangladesh.
4M. G. M. Choudhury, Electronic & Telecommunication Engineering, Daffodil International University, 102 Sukrabad, Mirpur Road, Dhaka.
Manuscript received on January 09, 2015. | Revised Manuscript received on January 27, 2015. | Manuscript published on February 28, 2015. PP: 60-64  | Volume-4 Issue-3, February 2015. | Retrieval Number:  C3728024315/2013©BEIESP

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Abstract: Cobalt sulfide thin films have been prepared by spray pyrolysis method on a glass substrate at constant substrate temperature 300°C.Structural, electrical and optical properties have been investigated. From XRD spectrogram, it is clear that the films are crystalline in nature with hexagonal structure having lattice constants, a=b=3.314 Å and c=4.604 Å. Scanning electron microscope (SEM) shows that Cobalt sulfide film exhibited more or less uniform and smooth surface morphology. Hall measurements indicate n-type semiconducting nature with carrier concentration ~1015 cm-3. The resistivity gradually decreases with increasing temperature which indicates the semiconducting nature of the material. The conductivity increases slowly with increasing the temperature and reaches maximum at the higher temperature. Activation energy is comparatively high (∆Ε > KT) and the values vary from 0.19 eV to 0.38 eV in the low temperature region and 0.42 eV to 0.54 eV in the high temperature region, respectively.
Keywords: Spray pyrolysis, CoS, XRD, SEM, Electrical properties and Activation energy.