Error Detection and Correction Methods for Memories used in System-on-Chip Designs
Gunduru Swathi Lakshmi1, Neelima K2, C. Subhas3
1Gunduru Swathi Lakshmi, M.Tech Student, Department of ECE, Research Centre for VLSI and Embedded Systems, Sree Vidyanikethan Engineering College, Sree Sainath Nagar, Tirupati (A.P), India.
2Neelima K, Research Centre, Assistant Professor, Department of ECE, Sree Vidyanikethan Engineering College, Sree Sainath Nagar, Tirupati (A.P), India.
3Dr. C. Subhas, Professor, Department of ECE, JNTUA College of Engineering, Kalikiri (A.P), India.
Manuscript received on 10 January 2019 | Revised Manuscript received on 20 January 2019 | Manuscript Published on 30 January 2019 | PP: 60-66 | Volume-8 Issue-2S2, January 2019 | Retrieval Number: 100.1/ijeat.B10140182S219/19©BEIESP
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Abstract: Memory is the basic necessity in any SoC design. Memories are classified into single port memory and multiport memory. Multiport memory has ability to source more efficient execution of operation and high speed performance when compared to single port. Testing of semiconductor memories is increasing because of high density of current in the chips. Due to increase in embedded on chip memory and memory density, the number of faults grow exponentially. Error detection works on concept of redundancy where extra bits are added for original data to detect the error bits. Error correction is done in two forms: one is receiver itself corrects the data and other is receiver sends the error bits to sender through feedback. Error detection and correction can be done in two ways. One is Single bit and other is multiple bit. Single bit error detection and correction is categorized into two as Classical Algorithm and March Algorithm. Multiple bits error detection and correction is categorized into Adjacent codes and Random codes. Different methods are applicable for different types of faults that manifest as errors.
Keywords: Faults and Its Types, Error Detection and Correction, Single Error Detection And Correction, Multiple Error Detection And Correction.
Scope of the Article: Probabilistic Models and Methods