Spectral, HR-XRD, Thermal and Dielectric Studies on Mixed Solvent Grown DAST Single Crystals
M. Krishna Kumar
M. Krishna Kumar, Department of Physics, Kalasalingam Academy of Research and Education, Krishnankoil (Tamil Nadu), India.
Manuscript received on 24 November 2019 | Revised Manuscript received on 18 December 2019 | Manuscript Published on 30 December 2019 | PP: 352-355 | Volume-9 Issue-1S4 December 2019 | Retrieval Number: A11781291S419/19©BEIESP | DOI: 10.35940/ijeat.A1178.1291S419
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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC-BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)

Abstract: The highly meritorious single crystal ofDAST (4-N,N-dimethylamino-4’-N’-methylstilbazolium tosylate) was grown through solution growth technique. The grown single crystals crystalline perfection analysis was made by HRXRD studies. The dielectric constant (ε), dielectric loss (ε) of DAST crystal was studied at different temperatures. The thermal decomposition stages were examined by using thermogram of DAST crystal and also it was giving best description of kinetic changes. Dielectric character was studied to the DAST crystal. The dielectric character of DAST was too analyzed.
Keywords: Solution Growth, HRXRD, Thermo-Gravimetric Analysis, Dielectric Studies.
Scope of the Article: Thermal Engineering